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Tungsten Filament Scanning Electron Microscope, SE, 20x~60000x 20x~60000x Resolution 15nm With Detector SE, Optional BSE, EDS, CCD Standard X/Y/R 3 Axes Working Stage, Optional Five Axes Working Stage X/Y/Z/R/T 2-Stage Electromagnetic Condenser Lens, 1-...
Tungsten Filament Scanning Electron Microscope, SE, 20x~60000x 20x~60000x Resolution 15nm With Detector SE, Optional BSE, EDS, CCD Standard X/Y/R 3 Axes Working Stage, Optional Five Axes Working Stage X/Y/Z/R/T 2-Stage Electromagnetic Condenser Lens, 1-... more
Brand Name:OPTO-EDU
Model Number:A63.7006
Place of Origin:China
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...SEM manufacture experience, the whole EM series supports old system refurbished and customized system as SEM+, such as Electron Beam Lithography remodel, LaB6 upgrade,integrated with STM,AFM,Heating Stage;Cryo Stage;Tensile Stage;Micro-nano manipulator etc. System also has multiple interface at chamber for attaching most of the analysis detector in the market The EM69 series scanning electron microscope...
...SEM manufacture experience, the whole EM series supports old system refurbished and customized system as SEM+, such as Electron Beam Lithography remodel, LaB6 upgrade,integrated with STM,AFM,Heating Stage;Cryo Stage;Tensile Stage;Micro-nano manipulator etc. System also has multiple interface at chamber for attaching most of the analysis detector in the market The EM69 series scanning electron microscope... more
Brand Name:KYKY
Model Number:EM6910
Place of Origin:China
Tungsten Filament Scanning Electron Microscope / Sem Electron Microscope EM69 Std
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... wafer DSP SiO2 wafers Silicon oxide wafer 1inch 2inch 10x10mm Scanning electron microscope silicon wafer small square piece SEM Polished Silicon Wafer High-purity (11N) 1-12 inch single- and double-polished Czochralski wafers Sizes 1" 2" 3" 4" 5" 6" 8" ...
... wafer DSP SiO2 wafers Silicon oxide wafer 1inch 2inch 10x10mm Scanning electron microscope silicon wafer small square piece SEM Polished Silicon Wafer High-purity (11N) 1-12 inch single- and double-polished Czochralski wafers Sizes 1" 2" 3" 4" 5" 6" 8" ... more
Brand Name:ZMSH
Model Number:SI WAFER
Place of Origin:CHINA
10x10mm Scanning Electron Microscope P type Silicon Wafer Square Piece SEM
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... instance: the scanning electron micro sconezz(SEM).the transmission electron microscope(TEM)the material testing machine. the large-type metallurgical microscope,the endurance testing machine,the IAS-4 image analyzer, the American ARL ...
... instance: the scanning electron micro sconezz(SEM).the transmission electron microscope(TEM)the material testing machine. the large-type metallurgical microscope,the endurance testing machine,the IAS-4 image analyzer, the American ARL ... more
Brand Name:TISCO
Model Number:DN20、DN25、DN32、DN40、DN50
Place of Origin:CHINA
Sae 1006 Sae 1008 Low Carbon Steel Wire 5.5mm to 12mm
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...equipment, for instance: the scanning electron micro sconezz(SEM).the transmission electron microscope(TEM)the material testing machine. the large-type metallurgical microscope,the endurance testing machine,the IAS-4 image analyzer, the American...
...equipment, for instance: the scanning electron micro sconezz(SEM).the transmission electron microscope(TEM)the material testing machine. the large-type metallurgical microscope,the endurance testing machine,the IAS-4 image analyzer, the American... more
Brand Name:Evergrowrs
Model Number:316 304 303 304H, 17-4ph ,17-7ph ,15-5ph
Place of Origin:China
350mm Hot Rolled Deformed Steel Bars AiSi 304 Stainless Steel Rod
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... excellent flatness with less stress deformation. VP-430 is an ideal preparation equipment for EBSD (backscattered electron diffraction), AFM (atomic force microscope) & SEM (scanning electron microscopy) analysis and Nano indentation or micro-hardness
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..., eliminate the surface stress and bring excellent flatness with less stress deformation. VP-430 is an ideal preparation equipment for EBSD (backscattered electron diffraction), AFM (atomic force microscope) & SEM (scanning