| Categories | XRF Analyzer |
|---|---|
| Brand Name: | Lonroy |
| Model Number: | LR-A086 |
| Certification: | CE ISO ASTM |
| Place of Origin: | China |
| MOQ: | 1 |
| Price: | Negotaible |
| Payment Terms: | L/C,D/A,D/P,T/T,Western Union,MoneyGram |
| Supply Ability: | 200 |
| Delivery Time: | 5-8 work days |
| Packaging Details: | wooden package |
| Maximum Measuring Speed: | 2 mm/s |
| Marble Dimensions: | 500 mm × 800 mm |
| Z1 Linear Accuracy: | ≤±(0.5 +|0.02H|) μm |
| Warranty: | 1 Year |
| X-axis Driving Mode: | Electric |
| Y-axis Driving Mode: | Electric |
The surface topography measurement instrument is a measurement device specifically designed for the microscopic morphology analysis of high-precision parts, featuring high-precision measurement capabilities and excellent stability.
In the field of precision manufacturing, the traditional measurement method of just one dimension is no longer sufficient to meet the stringent quality requirements of modern industries for parts. Although conventional size detection can reflect the geometric tolerances of parts, it is difficult to capture the key influence of the surface micro-topography on the performance of the parts.
The topography measurement instrument breaks through the limitations of traditional measurement methods and is specifically designed for the microscopic morphology analysis of high-precision parts. It adopts advanced contact sensor technology to accurately measure surface features ranging from nanometers to micrometers.
Technical Parameters
Measuring Range | X-axis | 120-220 mm |
X-axis Resolution | 1.2 nm | |
Z-axis | 420 mm, 620 mm (optional) | |
Profile Sensor | Z1-axis Measuring Range | 30-60 mm |
Z1 Resolution | 1.2 nm | |
Profile Accuracy | Z1 Linear Accuracy | ≤±(0.5 +|0.02H|) μm |
Circular Arc | ±(1 + R/12) μm | |
Circular Arc Pt | ≤0.3 μm | |
Angle | ±1′ | |
Straightness | 0.3 μm/100 mm (cut-off wavelength 0.8) | |
Driving Speed | X-axis Driving Mode | Electric |
Y-axis Driving Mode | Electric | |
Maximum Measuring Speed | 2 mm/s | |
Marble Dimensions | 500 mm × 800 mm | |
Countertop Material | Natural marble |
|
Roughness Contour Compound Testing Machine Contour Measurement Equipment Roughness Profilometer
LR-A093 Roughness Contour Integrated Analyzer Surface Roughness Tester Contour Detector
Roundness And Waviness Automated Single Machine Laboratory Roundness And Waviness Meter
Surface Roughness Measuring Instrument LR-A089 Mechanical Roughness Analysis Testing Machine
CE ISO 9001 X-ray Diffractometer Crystal Metal Materials Analyzer AL-Y3000 XRD Diffraction
X-ray Diffractometer Multi-functional Nanomaterials Testing Equipment AL-Y3500 XRD Analyzer
XRD-XRF Integrated Analyzer AL-Y3500xrdf X-ray Diffraction Instrument XRF Spectrometer
Desktop Two-dimensional AL-Y500 X-ray Diffraction Equipment XRD Analysis Instrument
X-ray Fluorescence Metal Coating Thickness Gauge AL-NP-7010 Metal Elements Analyzer
Wavelength-dispersive X-ray Fluorescence Spectrometer AL-BP-9010 XRF Cement Testing Machine
